Guo, T., Ma, L., & Bian, Y. (2012). MEMS Characterization Based on Optical Measuring Methods. IntechOpen. https://doi.org/10.5772/27524
Chicago Style (17th ed.) CitationGuo, Tong, Long Ma, and Yan Bian. MEMS Characterization Based on Optical Measuring Methods. IntechOpen, 2012. https://doi.org/10.5772/27524.
MLA (9th ed.) CitationGuo, Tong, et al. MEMS Characterization Based on Optical Measuring Methods. IntechOpen, 2012. https://doi.org/10.5772/27524.
Warning: These citations may not always be 100% accurate.