Influence of Ionizing Radiation and Hot Carrier Injection on Metal-Oxide-Semiconductor Transistors

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Influence of Ionizing Radiation and Hot Carrier Injection on Metal-Oxide-Semiconductor Transistors

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Detalles Bibliográficos
Autores principales:	Pejović, Momčilo, Osmokrović, Predrag, Pejović, Milica, Stanković, Koviljka
Formato:	Electrónico Capítulo de libro
Lenguaje:	inglés
Publicado:	IntechOpen 2012
Materias:	Physical Sciences, Engineering and Technology
Acceso en línea:	https://www.intechopen.com/chapters/32116
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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