Influence of Ionizing Radiation and Hot Carrier Injection on Metal-Oxide-Semiconductor Transistors

None

Saved in:
Bibliographic Details
Main Authors: Pejović, Momčilo, Osmokrović, Predrag, Pejović, Milica, Stanković, Koviljka
Format: Electronic Book Chapter
Language:English
Published: IntechOpen 2012
Subjects:
Online Access:https://www.intechopen.com/chapters/32116
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1839566356259799040
author Pejović, Momčilo
Osmokrović, Predrag
Pejović, Milica
Stanković, Koviljka
author_facet Pejović, Momčilo
Osmokrović, Predrag
Pejović, Milica
Stanković, Koviljka
author_sort Pejović, Momčilo
collection InTech Open eBooks
description None
doi_str_mv 10.5772/39263
first_indexed 2025-08-04T22:39:47Z
format Electronic
Book Chapter
fullrecord <oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><identifier>InTech-32116</identifier><datestamp>2012-03-09</datestamp> <dc:title>Influence of Ionizing Radiation and Hot Carrier Injection on Metal-Oxide-Semiconductor Transistors</dc:title> <dc:creator>Momčilo Pejović</dc:creator> <dc:creator>Predrag Osmokrović</dc:creator> <dc:creator>Milica Pejović</dc:creator> <dc:creator>Koviljka Stanković</dc:creator> <dc:subject>Physical Sciences, Engineering and Technology</dc:subject> <dc:description>None</dc:description> <dc:publisher>IntechOpen</dc:publisher> <dc:date>2012-03-09</dc:date> <dc:type>Chapter, Part Of Book</dc:type> <dc:identifier>https://www.intechopen.com/chapters/32116</dc:identifier> <dc:identifier>doi:10.5772/39263</dc:identifier> <dc:language>en</dc:language> <dc:relation>ISBN:978-953-51-0196-3</dc:relation> <dc:rights>https://creativecommons.org/licenses/by/3.0/</dc:rights> <dc:source>https://www.intechopen.com/books/1562 ; Current Topics in Ionizing Radiation Research</dc:source> </oai_dc:dc>
id InTech-32116
institution Matheson Library
isbn 978-953-51-0196-3
language English
last_indexed 2025-08-04T22:39:47Z
publishDate 2012
publisher IntechOpen
record_format intech
spelling InTech-321162012-03-09 Influence of Ionizing Radiation and Hot Carrier Injection on Metal-Oxide-Semiconductor Transistors Momčilo Pejović Predrag Osmokrović Milica Pejović Koviljka Stanković Physical Sciences, Engineering and Technology None IntechOpen 2012-03-09 Chapter, Part Of Book https://www.intechopen.com/chapters/32116 doi:10.5772/39263 en ISBN:978-953-51-0196-3 https://creativecommons.org/licenses/by/3.0/ https://www.intechopen.com/books/1562 ; Current Topics in Ionizing Radiation Research
spellingShingle Physical Sciences, Engineering and Technology
Pejović, Momčilo
Osmokrović, Predrag
Pejović, Milica
Stanković, Koviljka
Influence of Ionizing Radiation and Hot Carrier Injection on Metal-Oxide-Semiconductor Transistors
title Influence of Ionizing Radiation and Hot Carrier Injection on Metal-Oxide-Semiconductor Transistors
title_full Influence of Ionizing Radiation and Hot Carrier Injection on Metal-Oxide-Semiconductor Transistors
title_fullStr Influence of Ionizing Radiation and Hot Carrier Injection on Metal-Oxide-Semiconductor Transistors
title_full_unstemmed Influence of Ionizing Radiation and Hot Carrier Injection on Metal-Oxide-Semiconductor Transistors
title_short Influence of Ionizing Radiation and Hot Carrier Injection on Metal-Oxide-Semiconductor Transistors
title_sort influence of ionizing radiation and hot carrier injection on metal oxide semiconductor transistors
topic Physical Sciences, Engineering and Technology
url https://www.intechopen.com/chapters/32116
work_keys_str_mv AT pejovicmomcilo influenceofionizingradiationandhotcarrierinjectiononmetaloxidesemiconductortransistors
AT osmokrovicpredrag influenceofionizingradiationandhotcarrierinjectiononmetaloxidesemiconductortransistors
AT pejovicmilica influenceofionizingradiationandhotcarrierinjectiononmetaloxidesemiconductortransistors
AT stankovickoviljka influenceofionizingradiationandhotcarrierinjectiononmetaloxidesemiconductortransistors