X-Ray-Induced Radioresistance Against High-LET Radiations from Accelerated Neon-Ion Beams in Mice
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| Main Authors: | , , , , , , , |
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| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2012
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| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/32094 |
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| _version_ | 1839566352684154880 |
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| author | Wang, Bing Tanaka, Kaoru Ninomiya, Yasuharu Maruyama, Kouichi Varès, Guillaume Shang, Yi Eguchi-Kasai, Kiyomi Nenoi, Mitsuru |
| author_facet | Wang, Bing Tanaka, Kaoru Ninomiya, Yasuharu Maruyama, Kouichi Varès, Guillaume Shang, Yi Eguchi-Kasai, Kiyomi Nenoi, Mitsuru |
| author_sort | Wang, Bing |
| collection | InTech Open eBooks |
| description | None |
| doi_str_mv | 10.5772/32562 |
| first_indexed | 2025-08-04T22:39:43Z |
| format | Electronic Book Chapter |
| fullrecord | <oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><identifier>InTech-32094</identifier><datestamp>2012-03-09</datestamp>
<dc:title>X-Ray-Induced Radioresistance Against High-LET Radiations from Accelerated Neon-Ion Beams in Mice</dc:title>
<dc:creator>Bing Wang</dc:creator>
<dc:creator>Kaoru Tanaka</dc:creator>
<dc:creator>Yasuharu Ninomiya</dc:creator>
<dc:creator>Kouichi Maruyama</dc:creator>
<dc:creator>Guillaume Varès</dc:creator>
<dc:creator>Yi Shang</dc:creator>
<dc:creator>Kiyomi Eguchi-Kasai</dc:creator>
<dc:creator>Mitsuru Nenoi</dc:creator>
<dc:subject>Physical Sciences, Engineering and Technology</dc:subject>
<dc:description>None</dc:description>
<dc:publisher>IntechOpen</dc:publisher>
<dc:date>2012-03-09</dc:date>
<dc:type>Chapter, Part Of Book</dc:type>
<dc:identifier>https://www.intechopen.com/chapters/32094</dc:identifier>
<dc:identifier>doi:10.5772/32562</dc:identifier>
<dc:language>en</dc:language>
<dc:relation>ISBN:978-953-51-0196-3</dc:relation>
<dc:rights>https://creativecommons.org/licenses/by/3.0/</dc:rights>
<dc:source>https://www.intechopen.com/books/1562 ; Current Topics in Ionizing Radiation Research</dc:source>
</oai_dc:dc> |
| id | InTech-32094 |
| institution | Matheson Library |
| isbn | 978-953-51-0196-3 |
| language | English |
| last_indexed | 2025-08-04T22:39:43Z |
| publishDate | 2012 |
| publisher | IntechOpen |
| record_format | intech |
| spelling | InTech-320942012-03-09 X-Ray-Induced Radioresistance Against High-LET Radiations from Accelerated Neon-Ion Beams in Mice Bing Wang Kaoru Tanaka Yasuharu Ninomiya Kouichi Maruyama Guillaume Varès Yi Shang Kiyomi Eguchi-Kasai Mitsuru Nenoi Physical Sciences, Engineering and Technology None IntechOpen 2012-03-09 Chapter, Part Of Book https://www.intechopen.com/chapters/32094 doi:10.5772/32562 en ISBN:978-953-51-0196-3 https://creativecommons.org/licenses/by/3.0/ https://www.intechopen.com/books/1562 ; Current Topics in Ionizing Radiation Research |
| spellingShingle | Physical Sciences, Engineering and Technology Wang, Bing Tanaka, Kaoru Ninomiya, Yasuharu Maruyama, Kouichi Varès, Guillaume Shang, Yi Eguchi-Kasai, Kiyomi Nenoi, Mitsuru X-Ray-Induced Radioresistance Against High-LET Radiations from Accelerated Neon-Ion Beams in Mice |
| title | X-Ray-Induced Radioresistance Against High-LET Radiations from Accelerated Neon-Ion Beams in Mice |
| title_full | X-Ray-Induced Radioresistance Against High-LET Radiations from Accelerated Neon-Ion Beams in Mice |
| title_fullStr | X-Ray-Induced Radioresistance Against High-LET Radiations from Accelerated Neon-Ion Beams in Mice |
| title_full_unstemmed | X-Ray-Induced Radioresistance Against High-LET Radiations from Accelerated Neon-Ion Beams in Mice |
| title_short | X-Ray-Induced Radioresistance Against High-LET Radiations from Accelerated Neon-Ion Beams in Mice |
| title_sort | x ray induced radioresistance against high let radiations from accelerated neon ion beams in mice |
| topic | Physical Sciences, Engineering and Technology |
| url | https://www.intechopen.com/chapters/32094 |
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