Planar Microwave Sensors for Complex Permittivity Characterization of Materials and Their Applications

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Main Authors: Saeed, Kashif, Shafique, Muhammad F., Byrne, Matthew B., Hunter, Ian C.
Format: Electronic Book Chapter
Language:English
Published: IntechOpen 2012
Subjects:
Online Access:https://www.intechopen.com/chapters/29364
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author Saeed, Kashif
Shafique, Muhammad F.
Byrne, Matthew B.
Hunter, Ian C.
author_facet Saeed, Kashif
Shafique, Muhammad F.
Byrne, Matthew B.
Hunter, Ian C.
author_sort Saeed, Kashif
collection InTech Open eBooks
description None
doi_str_mv 10.5772/36302
first_indexed 2025-08-04T22:53:07Z
format Electronic
Book Chapter
fullrecord <oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><identifier>InTech-29364</identifier><datestamp>2012-02-24</datestamp> <dc:title>Planar Microwave Sensors for Complex Permittivity Characterization of Materials and Their Applications</dc:title> <dc:creator>Kashif Saeed</dc:creator> <dc:creator>Muhammad F. Shafique</dc:creator> <dc:creator>Matthew B. Byrne</dc:creator> <dc:creator>Ian C. Hunter</dc:creator> <dc:subject>Physical Sciences, Engineering and Technology</dc:subject> <dc:description>None</dc:description> <dc:publisher>IntechOpen</dc:publisher> <dc:date>2012-02-24</dc:date> <dc:type>Chapter, Part Of Book</dc:type> <dc:identifier>https://www.intechopen.com/chapters/29364</dc:identifier> <dc:identifier>doi:10.5772/36302</dc:identifier> <dc:language>en</dc:language> <dc:relation>ISBN:978-953-51-0103-1</dc:relation> <dc:rights>https://creativecommons.org/licenses/by/3.0/</dc:rights> <dc:source>https://www.intechopen.com/books/1942 ; Applied Measurement Systems</dc:source> </oai_dc:dc>
id InTech-29364
institution Matheson Library
isbn 978-953-51-0103-1
language English
last_indexed 2025-08-04T22:53:07Z
publishDate 2012
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spelling InTech-293642012-02-24 Planar Microwave Sensors for Complex Permittivity Characterization of Materials and Their Applications Kashif Saeed Muhammad F. Shafique Matthew B. Byrne Ian C. Hunter Physical Sciences, Engineering and Technology None IntechOpen 2012-02-24 Chapter, Part Of Book https://www.intechopen.com/chapters/29364 doi:10.5772/36302 en ISBN:978-953-51-0103-1 https://creativecommons.org/licenses/by/3.0/ https://www.intechopen.com/books/1942 ; Applied Measurement Systems
spellingShingle Physical Sciences, Engineering and Technology
Saeed, Kashif
Shafique, Muhammad F.
Byrne, Matthew B.
Hunter, Ian C.
Planar Microwave Sensors for Complex Permittivity Characterization of Materials and Their Applications
title Planar Microwave Sensors for Complex Permittivity Characterization of Materials and Their Applications
title_full Planar Microwave Sensors for Complex Permittivity Characterization of Materials and Their Applications
title_fullStr Planar Microwave Sensors for Complex Permittivity Characterization of Materials and Their Applications
title_full_unstemmed Planar Microwave Sensors for Complex Permittivity Characterization of Materials and Their Applications
title_short Planar Microwave Sensors for Complex Permittivity Characterization of Materials and Their Applications
title_sort planar microwave sensors for complex permittivity characterization of materials and their applications
topic Physical Sciences, Engineering and Technology
url https://www.intechopen.com/chapters/29364
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AT shafiquemuhammadf planarmicrowavesensorsforcomplexpermittivitycharacterizationofmaterialsandtheirapplications
AT byrnematthewb planarmicrowavesensorsforcomplexpermittivitycharacterizationofmaterialsandtheirapplications
AT hunterianc planarmicrowavesensorsforcomplexpermittivitycharacterizationofmaterialsandtheirapplications