A Practical Application of X-Ray Spectroscopy in Ti-Al-N and Cr-Al-N Thin Films
None
Saved in:
| Main Authors: | Ipaz, Leonid, Aperador, William, Caicedo, Julio, Esteve, Joan, Zambrano, Gustavo |
|---|---|
| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2012
|
| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/27336 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Study of CrAlN Multilayred Thin Films
by: Ibrahim, Tlili, et al.
Published: (2011) -
Effects of Doping Cr and Cr-Ni on the Properties of TiAlN Thin Films under Different Bias Voltage
by: LIANG Wei-zhong, WANG Cheng-lei, ZHANG Ke-xiang, LIANG Chao-jie, XIE Ying-guang, LIN De-min
Published: (2021-02-01) -
Research Progress of (Ti,Al,Cr)N Hard Film System
by: LIU Cong, ZHANG Jun, ZHANG Re - han, LI Ning
Published: (2021-03-01) -
Features of the receiving of piezoelectric thin films by plasma spraying of powdery AlN
by: V. S. Feshchenko, et al.
Published: (2020-03-01) -
Controlled Growth of C-Oriented AlN Thin Films: Experimental Deposition and Characterization
by: García-Méndez, Manuel
Published: (2012)


