Controlled Growth of C-Oriented AlN Thin Films: Experimental Deposition and Characterization
None
Saved in:
Main Author: | García-Méndez, Manuel |
---|---|
Format: | Electronic Book Chapter |
Language: | English |
Published: |
IntechOpen
2012
|
Subjects: | |
Online Access: | https://www.intechopen.com/chapters/26210 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Growth and characterization of aluminum nitride (AlN) thin film on steel using reactive sputtering deposition
by: Amit Bhargav, et al.
Published: (2025-01-01) -
Effect of temperature and deposition power on microstructure and properties of magnetron sputtered thin AlN coatings
by: Vasilina Lapitskaya, et al.
Published: (2025-08-01) -
MOCVD-grown, ultra-thin barrier AlN/GaN/AlN HEMTs fabricated using commercial GaN foundry process for Ka-band operation
by: Reet Chaudhuri, et al.
Published: (2025-01-01) -
The propagation characteristics of acoustic surface waves and the applications of power ultrasound based on AlN/GaN piezoelectric thin films
by: Tao Zhang, et al.
Published: (2025-09-01) -
Development of 2" AlN Substrates Using SiC Seeds
by: Avdeev, O.V., et al.
Published: (2012)