In-Situ Supply-Noise Measurement in LSIs with Millivolt Accuracy and Nanosecond-Order Time Resolution

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In-Situ Supply-Noise Measurement in LSIs with Millivolt Accuracy and Nanosecond-Order Time Resolution

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Bibliographic Details
Main Author:	Kanno, Yusuke
Format:	Electronic Book Chapter
Language:	English
Published:	IntechOpen 2011
Subjects:	Physical Sciences, Engineering and Technology
Online Access:	https://www.intechopen.com/chapters/24304
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