In-Situ Supply-Noise Measurement in LSIs with Millivolt Accuracy and Nanosecond-Order Time Resolution
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| Main Author: | |
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| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2011
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| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/24304 |
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| Summary: | None |
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| ISBN: | 978-953-307-406-1 |
| DOI: | 10.5772/27833 |