Study of Degradation Products and Degradation Pathways of ECD and Its Drug Product, ECD Kit

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Main Authors: Liu, Kung-Tien, Lin, Yu-Yung, Hsia, Yi-Chih, Zhao, Jian-Hua, Su, Chang-Yung, Shen, Shang-Yu, Men, Lee-Chung, Shen, Lie-Hang
Format: Electronic Book Chapter
Language:English
Published: IntechOpen 2011
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Online Access:https://www.intechopen.com/chapters/23732
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author Liu, Kung-Tien
Lin, Yu-Yung
Hsia, Yi-Chih
Zhao, Jian-Hua
Su, Chang-Yung
Shen, Shang-Yu
Men, Lee-Chung
Shen, Lie-Hang
author_facet Liu, Kung-Tien
Lin, Yu-Yung
Hsia, Yi-Chih
Zhao, Jian-Hua
Su, Chang-Yung
Shen, Shang-Yu
Men, Lee-Chung
Shen, Lie-Hang
author_sort Liu, Kung-Tien
collection InTech Open eBooks
description None
doi_str_mv 10.5772/19764
first_indexed 2025-08-04T21:58:22Z
format Electronic
Book Chapter
fullrecord <oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><identifier>InTech-23732</identifier><datestamp>2011-11-09</datestamp> <dc:title>Study of Degradation Products and Degradation Pathways of ECD and Its Drug Product, ECD Kit</dc:title> <dc:creator>Kung-Tien Liu</dc:creator> <dc:creator>Yu-Yung Lin</dc:creator> <dc:creator>Yi-Chih Hsia</dc:creator> <dc:creator>Jian-Hua Zhao</dc:creator> <dc:creator>Chang-Yung Su</dc:creator> <dc:creator>Shang-Yu Shen</dc:creator> <dc:creator>Lee-Chung Men</dc:creator> <dc:creator>Lie-Hang Shen</dc:creator> <dc:subject>Physical Sciences, Engineering and Technology</dc:subject> <dc:description>None</dc:description> <dc:publisher>IntechOpen</dc:publisher> <dc:date>2011-11-09</dc:date> <dc:type>Chapter, Part Of Book</dc:type> <dc:identifier>https://www.intechopen.com/chapters/23732</dc:identifier> <dc:identifier>doi:10.5772/19764</dc:identifier> <dc:language>en</dc:language> <dc:relation>ISBN:978-953-307-683-6</dc:relation> <dc:rights>https://creativecommons.org/licenses/by/3.0/</dc:rights> <dc:source>https://www.intechopen.com/books/632 ; Wide Spectra of Quality Control</dc:source> </oai_dc:dc>
id InTech-23732
institution Matheson Library
isbn 978-953-307-683-6
language English
last_indexed 2025-08-04T21:58:22Z
publishDate 2011
publisher IntechOpen
record_format intech
spelling InTech-237322011-11-09 Study of Degradation Products and Degradation Pathways of ECD and Its Drug Product, ECD Kit Kung-Tien Liu Yu-Yung Lin Yi-Chih Hsia Jian-Hua Zhao Chang-Yung Su Shang-Yu Shen Lee-Chung Men Lie-Hang Shen Physical Sciences, Engineering and Technology None IntechOpen 2011-11-09 Chapter, Part Of Book https://www.intechopen.com/chapters/23732 doi:10.5772/19764 en ISBN:978-953-307-683-6 https://creativecommons.org/licenses/by/3.0/ https://www.intechopen.com/books/632 ; Wide Spectra of Quality Control
spellingShingle Physical Sciences, Engineering and Technology
Liu, Kung-Tien
Lin, Yu-Yung
Hsia, Yi-Chih
Zhao, Jian-Hua
Su, Chang-Yung
Shen, Shang-Yu
Men, Lee-Chung
Shen, Lie-Hang
Study of Degradation Products and Degradation Pathways of ECD and Its Drug Product, ECD Kit
title Study of Degradation Products and Degradation Pathways of ECD and Its Drug Product, ECD Kit
title_full Study of Degradation Products and Degradation Pathways of ECD and Its Drug Product, ECD Kit
title_fullStr Study of Degradation Products and Degradation Pathways of ECD and Its Drug Product, ECD Kit
title_full_unstemmed Study of Degradation Products and Degradation Pathways of ECD and Its Drug Product, ECD Kit
title_short Study of Degradation Products and Degradation Pathways of ECD and Its Drug Product, ECD Kit
title_sort study of degradation products and degradation pathways of ecd and its drug product ecd kit
topic Physical Sciences, Engineering and Technology
url https://www.intechopen.com/chapters/23732
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