Infrared Holography for Wavefront Reconstruction and Interferometric Metrology

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Main Authors: Nicola, Sergio De, Geltrude, Andrea, Locatelli, Massimiliano, Al-Naimee, Kais, Meucci, Riccardo, Arecchi, F.Tito
Format: Electronic Book Chapter
Language:English
Published: IntechOpen 2011
Subjects:
Online Access:https://www.intechopen.com/chapters/23232
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author Nicola, Sergio De
Geltrude, Andrea
Locatelli, Massimiliano
Al-Naimee, Kais
Meucci, Riccardo
Arecchi, F.Tito
author_facet Nicola, Sergio De
Geltrude, Andrea
Locatelli, Massimiliano
Al-Naimee, Kais
Meucci, Riccardo
Arecchi, F.Tito
author_sort Nicola, Sergio De
collection InTech Open eBooks
description None
doi_str_mv 10.5772/19827
first_indexed 2025-08-04T21:50:34Z
format Electronic
Book Chapter
fullrecord <oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><identifier>InTech-23232</identifier><datestamp>2011-11-09</datestamp> <dc:title>Infrared Holography for Wavefront Reconstruction and Interferometric Metrology</dc:title> <dc:creator>Sergio De Nicola</dc:creator> <dc:creator>Andrea Geltrude</dc:creator> <dc:creator>Massimiliano Locatelli</dc:creator> <dc:creator>Kais Al-Naimee</dc:creator> <dc:creator>Riccardo Meucci</dc:creator> <dc:creator>F.Tito Arecchi</dc:creator> <dc:subject>Physical Sciences, Engineering and Technology</dc:subject> <dc:description>None</dc:description> <dc:publisher>IntechOpen</dc:publisher> <dc:date>2011-11-09</dc:date> <dc:type>Chapter, Part Of Book</dc:type> <dc:identifier>https://www.intechopen.com/chapters/23232</dc:identifier> <dc:identifier>doi:10.5772/19827</dc:identifier> <dc:language>en</dc:language> <dc:relation>ISBN:978-953-307-729-1</dc:relation> <dc:rights>https://creativecommons.org/licenses/by/3.0/</dc:rights> <dc:source>https://www.intechopen.com/books/516 ; Advanced Holography - Metrology and Imaging</dc:source> </oai_dc:dc>
id InTech-23232
institution Matheson Library
isbn 978-953-307-729-1
language English
last_indexed 2025-08-04T21:50:34Z
publishDate 2011
publisher IntechOpen
record_format intech
spelling InTech-232322011-11-09 Infrared Holography for Wavefront Reconstruction and Interferometric Metrology Sergio De Nicola Andrea Geltrude Massimiliano Locatelli Kais Al-Naimee Riccardo Meucci F.Tito Arecchi Physical Sciences, Engineering and Technology None IntechOpen 2011-11-09 Chapter, Part Of Book https://www.intechopen.com/chapters/23232 doi:10.5772/19827 en ISBN:978-953-307-729-1 https://creativecommons.org/licenses/by/3.0/ https://www.intechopen.com/books/516 ; Advanced Holography - Metrology and Imaging
spellingShingle Physical Sciences, Engineering and Technology
Nicola, Sergio De
Geltrude, Andrea
Locatelli, Massimiliano
Al-Naimee, Kais
Meucci, Riccardo
Arecchi, F.Tito
Infrared Holography for Wavefront Reconstruction and Interferometric Metrology
title Infrared Holography for Wavefront Reconstruction and Interferometric Metrology
title_full Infrared Holography for Wavefront Reconstruction and Interferometric Metrology
title_fullStr Infrared Holography for Wavefront Reconstruction and Interferometric Metrology
title_full_unstemmed Infrared Holography for Wavefront Reconstruction and Interferometric Metrology
title_short Infrared Holography for Wavefront Reconstruction and Interferometric Metrology
title_sort infrared holography for wavefront reconstruction and interferometric metrology
topic Physical Sciences, Engineering and Technology
url https://www.intechopen.com/chapters/23232
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AT geltrudeandrea infraredholographyforwavefrontreconstructionandinterferometricmetrology
AT locatellimassimiliano infraredholographyforwavefrontreconstructionandinterferometricmetrology
AT alnaimeekais infraredholographyforwavefrontreconstructionandinterferometricmetrology
AT meucciriccardo infraredholographyforwavefrontreconstructionandinterferometricmetrology
AT arecchiftito infraredholographyforwavefrontreconstructionandinterferometricmetrology