Importance of Simulation Studies in Analysis of Thin Film Transistors Based on Organic and Metal Oxide Semiconductors
None
Saved in:
| Main Authors: | Gupta, Dipti, Nayak, Pradipta K., Yoo, Seunghyup, Lee, Changhee, Hong, Yongtaek |
|---|---|
| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2011
|
| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/20885 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
A Compact Model for BEOL-Compatible Ferroelectric Thin Film Transistors With Metal/Ferroelectric/Semiconductor Structure
by: Wei Zhang, et al.
Published: (2025-01-01) -
THIN FILM TRANSISTORS WITH InGaZnO-SEMICONDUCTOR LAYER FOR ACTIVE MATRIX ADDRESSING
by: B. A. Kazarkin, et al.
Published: (2019-12-01) -
Influence of Ionizing Radiation and Hot Carrier Injection on Metal-Oxide-Semiconductor Transistors
by: Pejović, Momčilo, et al.
Published: (2012) -
Defect Density of States of Tin Oxide and Copper Oxide p‐type Thin‐film Transistors
by: Måns J. Mattsson, et al.
Published: (2025-07-01) -
Electrical Performance of ZTO Thin-Film Transistors and Inverters
by: Jieyang Wang, et al.
Published: (2025-06-01)


