Studies on Electrical and Retention Enhancement Properties of Metal-Ferroelectric-Insulator-Semiconductor with Radical Irradiation Treatments
None
Saved in:
| Main Authors: | Hai, Le Van, Kanashima, Takeshi, Okuyama, Masanori |
|---|---|
| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2011
|
| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/18042 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
A Compact Model for BEOL-Compatible Ferroelectric Thin Film Transistors With Metal/Ferroelectric/Semiconductor Structure
by: Wei Zhang, et al.
Published: (2025-01-01) -
Phase Transitions in Layered Semiconductor - Ferroelectrics
by: Dziaugys, Andrius, et al.
Published: (2011) -
Solar Cells on the Base of Semiconductor-Insulator-Semiconductor Structures
by: Simaschevici, Alexei, et al.
Published: (2011) -
BiFeO3 Thin Films Prepared by Chemical Solution Deposition with Approaches for Improvement of Ferroelectricity
by: Nakamura, Yoshitaka, et al.
Published: (2011) -
Ultraviolet Emission From Resonant Tunnelling Metal–Insulator– Semiconductor Light Emitting Tunnel Diodes
by: Chen-Sheng Lin, et al.
Published: (2017-01-01)


