Infrared Spectroscopic Ellipsometry for Ion-Implanted Silicon Wafers

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Infrared Spectroscopic Ellipsometry for Ion-Implanted Silicon Wafers

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Bibliographic Details
Main Authors:	Li, Liu, Xianming
Format:	Electronic Book Chapter
Language:	English
Published:	IntechOpen 2011
Subjects:	Physical Sciences, Engineering and Technology
Online Access:	https://www.intechopen.com/chapters/17726
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