APA (7th ed.) Citation

Li & Liu, X. (2011). Infrared Spectroscopic Ellipsometry for Ion-Implanted Silicon Wafers. IntechOpen. https://doi.org/10.5772/23438

Chicago Style (17th ed.) Citation

Li and Xianming Liu. Infrared Spectroscopic Ellipsometry for Ion-Implanted Silicon Wafers. IntechOpen, 2011. https://doi.org/10.5772/23438.

MLA (9th ed.) Citation

Li and Xianming Liu. Infrared Spectroscopic Ellipsometry for Ion-Implanted Silicon Wafers. IntechOpen, 2011. https://doi.org/10.5772/23438.

Warning: These citations may not always be 100% accurate.