Gage Repeatability and Reproducibility Methodologies Suitable for Complex Test Systems in Semi-Conductor Manufacturing
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| Main Authors: | , |
|---|---|
| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2011
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| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/17412 |
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| _version_ | 1839469353091727360 |
|---|---|
| author | Healy, Sandra Wallace, Michael |
| author_facet | Healy, Sandra Wallace, Michael |
| author_sort | Healy, Sandra |
| collection | InTech Open (e-Books) |
| description | None |
| doi_str_mv | 10.5772/intechopen.84018 |
| format | Electronic Book Chapter |
| fullrecord | <oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><identifier>InTech-17412</identifier><datestamp>2011-07-14</datestamp>
<dc:title>Gage Repeatability and Reproducibility Methodologies Suitable for Complex Test Systems in Semi-Conductor Manufacturing</dc:title>
<dc:creator>Sandra Healy</dc:creator>
<dc:creator>Michael Wallace</dc:creator>
<dc:subject>Social Sciences and Humanities</dc:subject>
<dc:description>None</dc:description>
<dc:publisher>IntechOpen</dc:publisher>
<dc:date>2011-07-14</dc:date>
<dc:type>Chapter, Part Of Book</dc:type>
<dc:identifier>https://www.intechopen.com/chapters/17412</dc:identifier>
<dc:identifier>doi:10.5772/intechopen.84018</dc:identifier>
<dc:language>en</dc:language>
<dc:relation>ISBN:978-953-307-370-5</dc:relation>
<dc:rights>https://creativecommons.org/licenses/by-nc-sa/3.0/</dc:rights>
<dc:source>https://www.intechopen.com/books/154 ; Six Sigma Projects and Personal Experiences</dc:source>
</oai_dc:dc> |
| id | InTech-17412 |
| institution | PNG Unitech |
| isbn | 978-953-307-370-5 |
| language | English |
| publishDate | 2011 |
| publisher | IntechOpen |
| record_format | intech |
| spelling | InTech-174122011-07-14 Gage Repeatability and Reproducibility Methodologies Suitable for Complex Test Systems in Semi-Conductor Manufacturing Sandra Healy Michael Wallace Social Sciences and Humanities None IntechOpen 2011-07-14 Chapter, Part Of Book https://www.intechopen.com/chapters/17412 doi:10.5772/intechopen.84018 en ISBN:978-953-307-370-5 https://creativecommons.org/licenses/by-nc-sa/3.0/ https://www.intechopen.com/books/154 ; Six Sigma Projects and Personal Experiences |
| spellingShingle | Social Sciences and Humanities Healy, Sandra Wallace, Michael Gage Repeatability and Reproducibility Methodologies Suitable for Complex Test Systems in Semi-Conductor Manufacturing |
| title | Gage Repeatability and Reproducibility Methodologies Suitable for Complex Test Systems in Semi-Conductor Manufacturing |
| title_full | Gage Repeatability and Reproducibility Methodologies Suitable for Complex Test Systems in Semi-Conductor Manufacturing |
| title_fullStr | Gage Repeatability and Reproducibility Methodologies Suitable for Complex Test Systems in Semi-Conductor Manufacturing |
| title_full_unstemmed | Gage Repeatability and Reproducibility Methodologies Suitable for Complex Test Systems in Semi-Conductor Manufacturing |
| title_short | Gage Repeatability and Reproducibility Methodologies Suitable for Complex Test Systems in Semi-Conductor Manufacturing |
| title_sort | gage repeatability and reproducibility methodologies suitable for complex test systems in semi conductor manufacturing |
| topic | Social Sciences and Humanities |
| url | https://www.intechopen.com/chapters/17412 |
| work_keys_str_mv | AT healysandra gagerepeatabilityandreproducibilitymethodologiessuitableforcomplextestsystemsinsemiconductormanufacturing AT wallacemichael gagerepeatabilityandreproducibilitymethodologiessuitableforcomplextestsystemsinsemiconductormanufacturing |