APA (7th ed.) Citation

Healy, S., & Wallace, M. (2011). Gage Repeatability and Reproducibility Methodologies Suitable for Complex Test Systems in Semi-Conductor Manufacturing. IntechOpen. https://doi.org/10.5772/intechopen.84018

Chicago Style (17th ed.) Citation

Healy, Sandra, and Michael Wallace. Gage Repeatability and Reproducibility Methodologies Suitable for Complex Test Systems in Semi-Conductor Manufacturing. IntechOpen, 2011. https://doi.org/10.5772/intechopen.84018.

MLA (9th ed.) Citation

Healy, Sandra, and Michael Wallace. Gage Repeatability and Reproducibility Methodologies Suitable for Complex Test Systems in Semi-Conductor Manufacturing. IntechOpen, 2011. https://doi.org/10.5772/intechopen.84018.

Warning: These citations may not always be 100% accurate.