Healy, S., & Wallace, M. (2011). Gage Repeatability and Reproducibility Methodologies Suitable for Complex Test Systems in Semi-Conductor Manufacturing. IntechOpen. https://doi.org/10.5772/intechopen.84018
Chicago Style (17th ed.) CitationHealy, Sandra, and Michael Wallace. Gage Repeatability and Reproducibility Methodologies Suitable for Complex Test Systems in Semi-Conductor Manufacturing. IntechOpen, 2011. https://doi.org/10.5772/intechopen.84018.
MLA (9th ed.) CitationHealy, Sandra, and Michael Wallace. Gage Repeatability and Reproducibility Methodologies Suitable for Complex Test Systems in Semi-Conductor Manufacturing. IntechOpen, 2011. https://doi.org/10.5772/intechopen.84018.
Warning: These citations may not always be 100% accurate.