Image Artifacts by Charge Pocket in Floating Diffusion Region on CMOS Image Sensors

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Image Artifacts by Charge Pocket in Floating Diffusion Region on CMOS Image Sensors

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Bibliographic Details
Main Authors:	Lee, Sang-Gi, Kim, Jong-Min, Bae, Sang-Hoon, Park, Jin-Won, Lee, Yoon-Jong
Format:	Electronic Book Chapter
Language:	English
Published:	IntechOpen 2011
Subjects:	Physical Sciences, Engineering and Technology
Online Access:	https://www.intechopen.com/chapters/17221
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