APA (7th ed.) Citation

Lee, S., Kim, J., Bae, S., Park, J., & Lee, Y. (2011). Image Artifacts by Charge Pocket in Floating Diffusion Region on CMOS Image Sensors. IntechOpen. https://doi.org/10.5772/20526

Chicago Style (17th ed.) Citation

Lee, Sang-Gi, Jong-Min Kim, Sang-Hoon Bae, Jin-Won Park, and Yoon-Jong Lee. Image Artifacts by Charge Pocket in Floating Diffusion Region on CMOS Image Sensors. IntechOpen, 2011. https://doi.org/10.5772/20526.

MLA (9th ed.) Citation

Lee, Sang-Gi, et al. Image Artifacts by Charge Pocket in Floating Diffusion Region on CMOS Image Sensors. IntechOpen, 2011. https://doi.org/10.5772/20526.