Lee, S., Kim, J., Bae, S., Park, J., & Lee, Y. (2011). Image Artifacts by Charge Pocket in Floating Diffusion Region on CMOS Image Sensors. IntechOpen. https://doi.org/10.5772/20526
Chicagoスタイル(17版)引用形式Lee, Sang-Gi, Jong-Min Kim, Sang-Hoon Bae, Jin-Won Park, , Yoon-Jong Lee. Image Artifacts by Charge Pocket in Floating Diffusion Region on CMOS Image Sensors. IntechOpen, 2011. https://doi.org/10.5772/20526.
MLA(9版)引用形式Lee, Sang-Gi, et al. Image Artifacts by Charge Pocket in Floating Diffusion Region on CMOS Image Sensors. IntechOpen, 2011. https://doi.org/10.5772/20526.
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