Near-Field Scanning Optical Microscopy Applied to the Study of Ferroelectric Materials

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Near-Field Scanning Optical Microscopy Applied to the Study of Ferroelectric Materials

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Bibliographic Details
Main Authors:	Canet-Ferrer, Josep, Martínez-Pastor, Juan P.
Format:	Electronic Book Chapter
Language:	English
Published:	IntechOpen 2011
Subjects:	Physical Sciences, Engineering and Technology
Online Access:	https://www.intechopen.com/chapters/16598
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