Near-Field Scanning Optical Microscopy Applied to the Study of Ferroelectric Materials
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| Main Authors: | , |
|---|---|
| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2011
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| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/16598 |
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| _version_ | 1839562886171590656 |
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| author | Canet-Ferrer, Josep Martínez-Pastor, Juan P. |
| author_facet | Canet-Ferrer, Josep Martínez-Pastor, Juan P. |
| author_sort | Canet-Ferrer, Josep |
| collection | InTech Open eBooks |
| description | None |
| doi_str_mv | 10.5772/16664 |
| first_indexed | 2025-08-04T21:44:37Z |
| format | Electronic Book Chapter |
| fullrecord | <oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><identifier>InTech-16598</identifier><datestamp>2011-08-23</datestamp>
<dc:title>Near-Field Scanning Optical Microscopy Applied to the Study of Ferroelectric Materials</dc:title>
<dc:creator>Josep Canet-Ferrer</dc:creator>
<dc:creator>Juan P. Martínez-Pastor</dc:creator>
<dc:subject>Physical Sciences, Engineering and Technology</dc:subject>
<dc:description>None</dc:description>
<dc:publisher>IntechOpen</dc:publisher>
<dc:date>2011-08-23</dc:date>
<dc:type>Chapter, Part Of Book</dc:type>
<dc:identifier>https://www.intechopen.com/chapters/16598</dc:identifier>
<dc:identifier>doi:10.5772/16664</dc:identifier>
<dc:language>en</dc:language>
<dc:relation>ISBN:978-953-307-455-9</dc:relation>
<dc:rights>https://creativecommons.org/licenses/by-nc-sa/3.0/</dc:rights>
<dc:source>https://www.intechopen.com/books/428 ; Ferroelectrics - Characterization and Modeling</dc:source>
</oai_dc:dc> |
| id | InTech-16598 |
| institution | Matheson Library |
| isbn | 978-953-307-455-9 |
| language | English |
| last_indexed | 2025-08-04T21:44:37Z |
| publishDate | 2011 |
| publisher | IntechOpen |
| record_format | intech |
| spelling | InTech-165982011-08-23 Near-Field Scanning Optical Microscopy Applied to the Study of Ferroelectric Materials Josep Canet-Ferrer Juan P. Martínez-Pastor Physical Sciences, Engineering and Technology None IntechOpen 2011-08-23 Chapter, Part Of Book https://www.intechopen.com/chapters/16598 doi:10.5772/16664 en ISBN:978-953-307-455-9 https://creativecommons.org/licenses/by-nc-sa/3.0/ https://www.intechopen.com/books/428 ; Ferroelectrics - Characterization and Modeling |
| spellingShingle | Physical Sciences, Engineering and Technology Canet-Ferrer, Josep Martínez-Pastor, Juan P. Near-Field Scanning Optical Microscopy Applied to the Study of Ferroelectric Materials |
| title | Near-Field Scanning Optical Microscopy Applied to the Study of Ferroelectric Materials |
| title_full | Near-Field Scanning Optical Microscopy Applied to the Study of Ferroelectric Materials |
| title_fullStr | Near-Field Scanning Optical Microscopy Applied to the Study of Ferroelectric Materials |
| title_full_unstemmed | Near-Field Scanning Optical Microscopy Applied to the Study of Ferroelectric Materials |
| title_short | Near-Field Scanning Optical Microscopy Applied to the Study of Ferroelectric Materials |
| title_sort | near field scanning optical microscopy applied to the study of ferroelectric materials |
| topic | Physical Sciences, Engineering and Technology |
| url | https://www.intechopen.com/chapters/16598 |
| work_keys_str_mv | AT canetferrerjosep nearfieldscanningopticalmicroscopyappliedtothestudyofferroelectricmaterials AT martinezpastorjuanp nearfieldscanningopticalmicroscopyappliedtothestudyofferroelectricmaterials |