In-Situ Analysis of Optoelectronic Properties of Semiconductor Nanostructures and Defects in Transmission Electron Microscopes

QR Code

In-Situ Analysis of Optoelectronic Properties of Semiconductor Nanostructures and Defects in Transmission Electron Microscopes

None

Saved in:

Bibliographic Details
Main Authors:	Ohno, Yutaka, Yonenega, Ichiro, Takeda, Seiji
Format:	Electronic Book Chapter
Language:	English
Published:	IntechOpen 2011
Subjects:	Physical Sciences, Engineering and Technology
Online Access:	https://www.intechopen.com/chapters/15247
Tags:	Add Tag No Tags, Be the first to tag this record!

Similar Items

The operation of the transmission electron microscope
by: Chescoe, Dawn
Published: (1984)

In Situ Experiments in the Scanning Electron Microscope Chamber
by: Podor, Renaud, et al.
Published: (2012)

Scanning Electron Microscope for Characterising of Micro- and Nanostructured Titanium Surfaces
by: Aeimbhu, Areeya
Published: (2012)

ZnO Nanostructures for Optoelectronic Applications
by: Sood, Ashok K., et al.
Published: (2011)

Optoelectronic line transmission :
by: Tricker, Raymond
Published: (1989)

Organic Semiconductor Based Heterostructures for Optoelectronic Devices
by: Stanculescu, Anca, et al.
Published: (2011)

Electronic properties of doped semiconductors /
by: Shklovski i, B. I. (Boris Isaakovich), 1944-
Published: (1984)

PROSPECTIVE SEMICONDUCTING COMPOUNDS AND NANOSTRUCTURES FOR OPTOELECTRONICS, PHOTOVOLTAICS AND SPINTRONICS
by: A. V. Krivosheeva
Published: (2019-06-01)

Conventional Transmission Electron Microscope Observation of Electric and Magnetic Fields
by: Sasaki, Katsuhiro, et al.
Published: (2012)

Mechanical and Electronic Properties of Graphene Nanostructures
by: Faccio, Ricardo, et al.
Published: (2011)

SILICON-GERMANIUM NANOSTRUCTURES WITH GERMANIUM QUANTUM DOTS FOR OPTOELECTRONIC APPLICATIONS
by: A. V. Mudryi, et al.
Published: (2015-04-01)

Air Exposure Improvement of Optical Properties of Hydrogenated Nanostructured Silicon Thin Films for Optoelectronic Application
by: Ali, Atif Mossad
Published: (2011)

Self-Similarity in Semiconductors: Electronic and Optical Properties
by: Gaggero-Sager, L. M., et al.
Published: (2011)

Optoelectronic Feedback in Semiconductor Light Sources: Optimization of Network Components for Synchronization
by: Abdalah, Sora F., et al.
Published: (2011)

Semiconductor electronics /
by: Ankrum, Paul Denzil
Published: (1971)

Semiconductor electronics /
by: Gibbons, James F.
Published: (1966)

The measurement of the vertical relief on metal-graphic microscopes of production of OJC «Optoelectronic systems»
by: A. G. Anisovich, et al.
Published: (2019-08-01)

The electron microscope in biology /
by: Grimstone, A. V.
Published: (1977)

Design of Peltier Element Based on Semiconductors with Hopping Electron Transfer via Defects
by: N. A. Poklonski, et al.
Published: (2021-03-01)

Introduction to high-speed electronics and optoelectronics /
by: Riaziat, Majid Leonard
Published: (1996)

The methodology of modeling of electronic properties of bulk semiconductor compounds
by: A. V. Krivosheeva, et al.
Published: (2019-06-01)

In-situ Release of Antiepileptic Drugs from Nanostructured Reservoirs
by: Lopez, Tessy, et al.
Published: (2011)

Semiconductors and electronic devices /
by: Bar-Lev, Adir
Published: (1984)

Semiconductor electronics design /
by: Manasse, Fred K.
Published: (1977)

The use of the scanning electron microscope
by: Hearle, J. W. S.
Published: (1972)

Band Structure and Magneto- Transport Properties in II-IV Nanostructures Semiconductors - Application to Infrared Detector Superlattices
by: Nafidi, Abdelhakim
Published: (2011)

Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A. /
Published: (1983)

Orientation Microscopy in the Transmission Electron Microscope - Investigations of Small Orientations Changes by Means of Orientation Mapping in TEM
by: Bieda, M., et al.
Published: (2012)

Fundamentals of semiconductor and tube electronics /
by: Romanowitz, H. Alex

Electron-hole droplets in semiconductors /
Published: (1983)

Electronic and Transport Properties of Defected Graphene Nanoribbons
by: Gorjizadeh, Narjes, et al.
Published: (2011)

Defects and radiation effects in semiconductors, 1980 : invited and contributed papers from the Eleventh International Conference on Defects and Radiation Effects in Semiconductors held in Oiso, Japan, 8-11 September 1980 /
by: Hasiguti, R. R.
Published: (1981)

NANOSTRUCTURED CARBON MATERIALS IN EMISSION ELECTRONICS
by: А. F. Belyanin, et al.
Published: (2017-06-01)

Solution-Processed Nanostructured Hybrid Materials Based on Graphene Oxide Flakes Decorated with Ligand-Exchanged PbS QDs: Synthesis, Characterization and Optoelectronic Properties
by: Giovanny Perez-Parra, et al.
Published: (2025-04-01)

Optoelectronics /
by: Watson, J.
Published: (1988)

Optoelectronics
by: Seippel, Robert G.
Published: (1980)

Quantitative characterization of topographic defects of semiconductor silicon wafers
by: S. F. Sianko, et al.
Published: (2019-06-01)

ESTIMATION OF TOPOGRAPHIC DEFECTS DIMENSIONS OF SEMICONDUCTOR SILICON STRUCTURES
by: S. F. Sianko, et al.
Published: (2018-03-01)

Cell Senescence as Observed by Electron Microscopic Radioautography
by: Nagata, Tetsuji
Published: (2012)

Encapsulation of Metal Nanoparticles by Metal–Organic Framework Imaged with In Situ Liquid Phase Transmission Electron Microscopy
by: Guoming Lin, et al.
Published: (2025-07-01)