APA (7th ed.) Citation

Ohno, Y., Yonenega, I., & Takeda, S. (2011). In-Situ Analysis of Optoelectronic Properties of Semiconductor Nanostructures and Defects in Transmission Electron Microscopes. IntechOpen. https://doi.org/10.5772/14813

Chicago Style (17th ed.) Citation

Ohno, Yutaka, Ichiro Yonenega, and Seiji Takeda. In-Situ Analysis of Optoelectronic Properties of Semiconductor Nanostructures and Defects in Transmission Electron Microscopes. IntechOpen, 2011. https://doi.org/10.5772/14813.

MLA (9th ed.) Citation

Ohno, Yutaka, et al. In-Situ Analysis of Optoelectronic Properties of Semiconductor Nanostructures and Defects in Transmission Electron Microscopes. IntechOpen, 2011. https://doi.org/10.5772/14813.