Enhanced Fourier Transforms for X-Ray Scattering Applications

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Enhanced Fourier Transforms for X-Ray Scattering Applications

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Dettagli Bibliografici
Autori principali:	Poust, Benjamin, Goorsky, Mark
Natura:	Elettronico Capitolo di libro
Lingua:	inglese
Pubblicazione:	IntechOpen 2011
Soggetti:	Physical Sciences, Engineering and Technology
Accesso online:	https://www.intechopen.com/chapters/15158
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