Savchenko, D. V., Shanina, B. D., & Kalabukhova, E. N. (2011). Identification and Kinetic Properties of the Photosensitive Impurities and Defects in High-Purity Semi-Insulating Silicon Carbide. IntechOpen. https://doi.org/10.5772/14302
Chicago Style (17th ed.) CitationSavchenko, D. V., B. D. Shanina, and E. N. Kalabukhova. Identification and Kinetic Properties of the Photosensitive Impurities and Defects in High-Purity Semi-Insulating Silicon Carbide. IntechOpen, 2011. https://doi.org/10.5772/14302.
MLA (9th ed.) CitationSavchenko, D. V., et al. Identification and Kinetic Properties of the Photosensitive Impurities and Defects in High-Purity Semi-Insulating Silicon Carbide. IntechOpen, 2011. https://doi.org/10.5772/14302.
Warning: These citations may not always be 100% accurate.