Description of Topography of Surfaces and Thin Films with the use Fourier Transformation, Obtained from Non-Standard Optical Measurements
None
Saved in:
| Main Author: | Jaglarz, Janusz |
|---|---|
| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2011
|
| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/14632 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Coherence Correlation Interferometry in Surface Topography Measurements
by: Kaplonek, Wojciech, et al.
Published: (2012) -
Surface Micro Topography Measurement Using Interferometry
by: Abdelsalam, Dahi Ghareab
Published: (2012) -
Theoretical Description of the Fourier Transform of the Absolute Amplitude Spectra and Its Applications
by: Csoka, Levente, et al.
Published: (2011) -
The Fourier Transform in Optics: Analogous Experiment and Digital Calculus
by: Logofătu, Petre Cătălin, et al.
Published: (2011) -
Surface Topography and Texture Restoration from Sectional Optical Imaging by Focus Analysis
by: Fernandes, Mathieu, et al.
Published: (2012)


