APA (7th ed.) Citation

Pan, X., & Graeb, H. (2011). Lifetime Yield Optimization of Analog Circuits Considering Process Variations and Parameter Degradations. IntechOpen. https://doi.org/10.5772/14322

Chicago Style (17th ed.) Citation

Pan, Xin, and Helmut Graeb. Lifetime Yield Optimization of Analog Circuits Considering Process Variations and Parameter Degradations. IntechOpen, 2011. https://doi.org/10.5772/14322.

MLA (9th ed.) Citation

Pan, Xin, and Helmut Graeb. Lifetime Yield Optimization of Analog Circuits Considering Process Variations and Parameter Degradations. IntechOpen, 2011. https://doi.org/10.5772/14322.

Warning: These citations may not always be 100% accurate.