Automated MOS Transistor Gamma Degradation Measurements Based on LabVIEW Environment
None
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2011
|
| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/12941 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1839561252108500992 |
|---|---|
| author | Oussalah, Slimane Djezzar, Boualem |
| author_facet | Oussalah, Slimane Djezzar, Boualem |
| author_sort | Oussalah, Slimane |
| collection | InTech Open eBooks |
| description | None |
| doi_str_mv | 10.5772/13538 |
| first_indexed | 2025-08-04T21:18:39Z |
| format | Electronic Book Chapter |
| fullrecord | <oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><identifier>InTech-12941</identifier><datestamp>2011-01-21</datestamp>
<dc:title>Automated MOS Transistor Gamma Degradation Measurements Based on LabVIEW Environment</dc:title>
<dc:creator>Slimane Oussalah</dc:creator>
<dc:creator>Boualem Djezzar</dc:creator>
<dc:subject>Physical Sciences, Engineering and Technology</dc:subject>
<dc:description>None</dc:description>
<dc:publisher>IntechOpen</dc:publisher>
<dc:date>2011-01-21</dc:date>
<dc:type>Chapter, Part Of Book</dc:type>
<dc:identifier>https://www.intechopen.com/chapters/12941</dc:identifier>
<dc:identifier>doi:10.5772/13538</dc:identifier>
<dc:language>en</dc:language>
<dc:relation>ISBN:978-953-307-521-1</dc:relation>
<dc:rights>https://creativecommons.org/licenses/by-nc-sa/3.0/</dc:rights>
<dc:source>https://www.intechopen.com/books/31 ; Modeling, Programming and Simulations Using LabVIEW&#8482; Software</dc:source>
</oai_dc:dc> |
| id | InTech-12941 |
| institution | Matheson Library |
| isbn | 978-953-307-521-1 |
| language | English |
| last_indexed | 2025-08-04T21:18:39Z |
| publishDate | 2011 |
| publisher | IntechOpen |
| record_format | intech |
| spelling | InTech-129412011-01-21 Automated MOS Transistor Gamma Degradation Measurements Based on LabVIEW Environment Slimane Oussalah Boualem Djezzar Physical Sciences, Engineering and Technology None IntechOpen 2011-01-21 Chapter, Part Of Book https://www.intechopen.com/chapters/12941 doi:10.5772/13538 en ISBN:978-953-307-521-1 https://creativecommons.org/licenses/by-nc-sa/3.0/ https://www.intechopen.com/books/31 ; Modeling, Programming and Simulations Using LabVIEW™ Software |
| spellingShingle | Physical Sciences, Engineering and Technology Oussalah, Slimane Djezzar, Boualem Automated MOS Transistor Gamma Degradation Measurements Based on LabVIEW Environment |
| title | Automated MOS Transistor Gamma Degradation Measurements Based on LabVIEW Environment |
| title_full | Automated MOS Transistor Gamma Degradation Measurements Based on LabVIEW Environment |
| title_fullStr | Automated MOS Transistor Gamma Degradation Measurements Based on LabVIEW Environment |
| title_full_unstemmed | Automated MOS Transistor Gamma Degradation Measurements Based on LabVIEW Environment |
| title_short | Automated MOS Transistor Gamma Degradation Measurements Based on LabVIEW Environment |
| title_sort | automated mos transistor gamma degradation measurements based on labview environment |
| topic | Physical Sciences, Engineering and Technology |
| url | https://www.intechopen.com/chapters/12941 |
| work_keys_str_mv | AT oussalahslimane automatedmostransistorgammadegradationmeasurementsbasedonlabviewenvironment AT djezzarboualem automatedmostransistorgammadegradationmeasurementsbasedonlabviewenvironment |