Memory and LSI.

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Bibliographic Details
Corporate Authors:	Semiconductor Test Symposium (1974 : Cherry Hill, New Jersey), Institute of Electrical and Electronics Engineering. Computer Society, Institute of Electrical and Electronics Engineering. Philadelphia Section
Format:	Conference Proceeding
Language:	English
Published:	[New York : IEEE, c1974].
Subjects:	Semiconductors > Testing. Semiconductor storage devices. Flash memories (Computers).
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MARC


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111	1	0	\|a Semiconductor Test Symposium (1974 : Cherry Hill, New Jersey).
245	1	0	\|a Memory and LSI.
260			\|a [New York : \|b IEEE, \|c c1974].
300			\|a 261 p.
650			\|a Semiconductors \|x Testing.
650			\|a Semiconductor storage devices.
650			\|a Flash memories (Computers).
710	2	0	\|a Institute of Electrical and Electronics Engineering. Computer Society.
710	2	0	\|a Institute of Electrical and Electronics Engineering. Philadelphia Section.
942			\|2 ddc
999			\|c 83131 \|d 83131
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