Semiconductor Test Symposium (1974 : Cherry Hill, New Jersey), Institute of Electrical and Electronics Engineering. Computer Society, & Institute of Electrical and Electronics Engineering. Philadelphia Section. (1974). Memory and LSI. IEEE.
Chicago Style (17th ed.) CitationSemiconductor Test Symposium (1974 : Cherry Hill, New Jersey), Institute of Electrical and Electronics Engineering. Computer Society, and Institute of Electrical and Electronics Engineering. Philadelphia Section. Memory and LSI. [New York: IEEE, 1974.
MLA (9th ed.) CitationSemiconductor Test Symposium (1974 : Cherry Hill, New Jersey), et al. Memory and LSI. IEEE, 1974.
Warning: These citations may not always be 100% accurate.