Digital integrated circuit testing from a quality perspective /
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York :
Van Nostrand Reinhold,
c1993.
|
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
MARC
| LEADER | 00000pam a2200000 a 4500 | ||
|---|---|---|---|
| 001 | 00232696 | ||
| 003 | PWmBRO | ||
| 005 | 20240602103803.0 | ||
| 008 | 941020s1993 nyua b 001 0 eng | ||
| 020 | |a 0442006438 | ||
| 100 | 1 | |a Hnatek, Eugene R. | |
| 245 | 1 | 0 | |a Digital integrated circuit testing from a quality perspective / |c Eugene R. Hnatek. |
| 260 | |a New York : |b Van Nostrand Reinhold, |c c1993. | ||
| 300 | |a x, 179 p. : |b ill. | ||
| 650 | 0 | |a Digital integrated circuits |x Testing |x Quality control. | |
| 942 | |2 ddc | ||
| 999 | |c 80880 |d 80880 | ||
| 952 | |0 0 |1 127 |4 0 |7 0 |a ML015 |b ML015 |c ML015 |d 2024-06-02 |l 0 |o 621.381548 H677 |p 104219 |r 2019-03-04 00:00:00 |w 2019-03-04 |y BK | ||