Characterization of thin films and solid surfaces using proton-induced X-ray emission /
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| Main Author: | |
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| Corporate Author: | |
| Other Authors: | |
| Format: | Unknown |
| Language: | English |
| Published: |
[Washington] :
U.S. Dept. of the Interior, Bureau of Mines,
1980.
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| Series: | Report of investigations (United States. Bureau of Mines) ;
8455. |
| Subjects: | |
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