Tests, measurements, and characterization of electro-optic devices and systems : proceedings /

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Bibliographic Details
Other Authors:	Wadekar, Shekhar G., International Society for Optical Engineering
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, 1989.
Series:	SPIE proceedings series ; vol. 1180
Subjects:	Electrooptical devices > Measurement > Conference proceedings. Electrooptics > Measurement > Conference proceedings.
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245		\|a Tests, measurements, and characterization of electro-optic devices and systems : \|b proceedings / \|c [edited by] Shekhar G. Wadekar.
260		\|a Bellingham, Washington : \|b SPIE, \|c 1989.
300		\|a vi, 196 p. : ill.
440		\|a SPIE proceedings series ; vol. 1180
650		\|a Electrooptical devices \|x Measurement \|x Conference proceedings.
650		\|a Electrooptics \|x Measurement \|x Conference proceedings.
700		\|a Wadekar, Shekhar G.
700		\|a International Society for Optical Engineering.
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