Tests, measurements, and characterization of electro-optic devices and systems : proceedings /
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| Other Authors: | , |
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| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Washington :
SPIE,
1989.
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| Series: | SPIE proceedings series ; vol. 1180
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| Subjects: | |
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| Physical Description: | vi, 196 p. : ill. |
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| ISBN: | 0819402168 |