Wadekar, S. G., & International Society for Optical Engineering. (1989). Tests, measurements, and characterization of electro-optic devices and systems: Proceedings. SPIE.
Chicago Style (17th ed.) CitationWadekar, Shekhar G., and International Society for Optical Engineering. Tests, Measurements, and Characterization of Electro-optic Devices and Systems: Proceedings. Bellingham, Washington: SPIE, 1989.
MLA (9th ed.) CitationWadekar, Shekhar G., and International Society for Optical Engineering. Tests, Measurements, and Characterization of Electro-optic Devices and Systems: Proceedings. SPIE, 1989.
Warning: These citations may not always be 100% accurate.