Technical diagnostics /

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Bibliographic Details
Corporate Author: International Measurement Confederation
Other Authors: Kem eny, Tam as, Havrilla, K.
Format: Book
Language:English
Published: Commack, N.Y. : Nova Science Publishers, 1988.
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008 880826s1988 nyu 00100 eng
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245 0 0 |a Technical diagnostics /  |c edited by T. Kemeny & K. Havrilla. 
260 0 |a Commack, N.Y. :  |b Nova Science Publishers,  |c 1988. 
300 |a 1 v. (various pagings) 
650 0 |a Testing. 
650 0 |a Reliability (Engineering) 
700 1 0 |a Kem eny, Tam as. 
700 1 0 |a Havrilla, K. 
710 2 0 |a International Measurement Confederation. 
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