Electron microscopy and strength of crystals /
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| Corporate Author: | Berkeley International Materials Conference (1st : 1961 : Berkekey, California) |
|---|---|
| Other Authors: | Thomas, Gareth, Washburn, Jack |
| Format: | Conference Proceeding |
| Language: | English |
| Published: |
New York :
Interscience,
c1962.
|
| Subjects: | |
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