Electron microscopy and strength of crystals /
Saved in:
| Corporate Author: | |
|---|---|
| Other Authors: | , |
| Format: | Conference Proceeding |
| Language: | English |
| Published: |
New York :
Interscience,
c1962.
|
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Item Description: | Conference theme: The Impact of Transmission Electron Microscopy on Theories of the Strength of Crystals. Includes index. |
|---|---|
| Physical Description: | xi, 1022 p. : ill. ; 23 cm. |
| Bibliography: | Includes bibliographies. |