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Characterization of semiconductor materials /

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Bibliographic Details
Main Author: Kane, Philip F.
Other Authors: Larrabee, Graydon B.
Format: Book
Language:English
Published: New York : McGraw-Hill, 1970.
Series:Texas instruments electronics series
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LEADER 00000nam a2200000u 4500
001 01046594
003 PWmBRO
005 20240602103441.0
008 931020s1970 nyua b 00110 eng
010 |a 93034207  
090 |b 537.622/K17c 
100 1 0 |a Kane, Philip F. 
245 1 0 |a Characterization of semiconductor materials /  |c Philip F. Kane, Graydon B. Larrabee. 
260 0 |a New York :  |b McGraw-Hill,  |c 1970. 
300 |a xvi, 351 p. :  |b ill. 
440 0 |a Texas instruments electronics series 
650 0 |a Semiconductors 
700 1 0 |a Larrabee, Graydon B. 
942 |2 ddc 
952 |0 0  |1 0  |4 0  |6 537_622000000000000_K17C  |7 0  |9 99913  |a ML015  |b ML015  |c ML015  |d 2024-06-02  |l 0  |o 537.622 K17c  |p 094976  |r 2019-03-04 00:00:00  |w 2019-03-04 
994 0 1 |a 094976 
999 |c 75949  |d 75949