Characterization of semiconductor materials /
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| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
New York :
McGraw-Hill,
1970.
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| Series: | Texas instruments electronics series
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| Subjects: | |
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MARC
| LEADER | 00000nam a2200000u 4500 | ||
|---|---|---|---|
| 001 | 01046594 | ||
| 003 | PWmBRO | ||
| 005 | 20240602103441.0 | ||
| 008 | 931020s1970 nyua b 00110 eng | ||
| 010 | |a 93034207 | ||
| 090 | |b 537.622/K17c | ||
| 100 | 1 | 0 | |a Kane, Philip F. |
| 245 | 1 | 0 | |a Characterization of semiconductor materials / |c Philip F. Kane, Graydon B. Larrabee. |
| 260 | 0 | |a New York : |b McGraw-Hill, |c 1970. | |
| 300 | |a xvi, 351 p. : |b ill. | ||
| 440 | 0 | |a Texas instruments electronics series | |
| 650 | 0 | |a Semiconductors | |
| 700 | 1 | 0 | |a Larrabee, Graydon B. |
| 942 | |2 ddc | ||
| 952 | |0 0 |1 0 |4 0 |6 537_622000000000000_K17C |7 0 |9 99913 |a ML015 |b ML015 |c ML015 |d 2024-06-02 |l 0 |o 537.622 K17c |p 094976 |r 2019-03-04 00:00:00 |w 2019-03-04 | ||
| 994 | 0 | 1 | |a 094976 |
| 999 | |c 75949 |d 75949 | ||


