Characterization of semiconductor materials /
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Main Author: | |
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Other Authors: | |
Format: | Book |
Language: | English |
Published: |
New York :
McGraw-Hill,
1970.
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Series: | Texas instruments electronics series
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Subjects: | |
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MARC
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008 | 931020s1970 nyua b 00110 eng | ||
010 | |a 93034207 | ||
090 | |b 537.622/K17c | ||
100 | 1 | 0 | |a Kane, Philip F. |
245 | 1 | 0 | |a Characterization of semiconductor materials / |c Philip F. Kane, Graydon B. Larrabee. |
260 | 0 | |a New York : |b McGraw-Hill, |c 1970. | |
300 | |a xvi, 351 p. : |b ill. | ||
440 | 0 | |a Texas instruments electronics series | |
650 | 0 | |a Semiconductors | |
700 | 1 | 0 | |a Larrabee, Graydon B. |
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