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Characterization of thin films and solid surfaces using proton-induced X-ray emission /

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Bibliographic Details
Main Author: Sartwell, Bruce D.
Corporate Author: United States. Bureau of Mines
Other Authors: Campbell, Arthur Byron, 1924-
Format: Unknown
Language:English
Published: [Washington] : U.S. Dept. of the Interior, Bureau of Mines, 1980.
Series:Report of investigations (United States. Bureau of Mines) ; 8455.
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245 1 0 |a Characterization of thin films and solid surfaces using proton-induced X-ray emission /  |c by Bruce D. Sartwell and Arthur B. Campbell, III. 
260 0 |a [Washington] :  |b U.S. Dept. of the Interior, Bureau of Mines,  |c 1980. 
300 |a 22 p. :  |b ill. 
490 1 |a Report of investigations ;  |v 8455 
650 0 |a Thin films  |x Effect of radiation on. 
650 0 |a Solids  |x Surfaces. 
650 0 |a Proton-induced X-ray emission. 
700 1 0 |a Campbell, Arthur Byron,  |d 1924- 
710 2 0 |a United States.  |b Bureau of Mines. 
810 2 0 |a United States.  |b Bureau of Mines.  |t Report of investigations ;  |v 8455 
830 0 |a Report of investigations (United States. Bureau of Mines) ;  |v 8455. 
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