Sartwell, B. D., & Campbell, A. B. (1980). Characterization of thin films and solid surfaces using proton-induced X-ray emission. U.S. Dept. of the Interior, Bureau of Mines.
Chicago Style (17th ed.) CitationSartwell, Bruce D., and Arthur Byron Campbell. Characterization of Thin Films and Solid Surfaces Using Proton-induced X-ray Emission. [Washington]: U.S. Dept. of the Interior, Bureau of Mines, 1980.
MLA (9th ed.) CitationSartwell, Bruce D., and Arthur Byron Campbell. Characterization of Thin Films and Solid Surfaces Using Proton-induced X-ray Emission. U.S. Dept. of the Interior, Bureau of Mines, 1980.
Warning: These citations may not always be 100% accurate.