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Technical diagnostics /

I tiakina i:

Ngā taipitopito rārangi puna kōrero
Kaituhi rangatōpū:	International Measurement Confederation
Ētahi atu kaituhi:	Kem eny, Tam as, Havrilla, K.
Hōputu:	Pukapuka
Reo:	Ingarihi
I whakaputaina:	Commack, N.Y. : Nova Science Publishers, 1988.
Ngā marau:	Testing. Reliability (Engineering)
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MARC


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008	880826s1988 nyu 00100 eng
010			\|a 90011015
020			\|a 0941743411
090	0		\|b 620.0/044/T255
245	0	0	\|a Technical diagnostics / \|c edited by T. Kemeny & K. Havrilla.
260	0		\|a Commack, N.Y. : \|b Nova Science Publishers, \|c 1988.
300			\|a 1 v. (various pagings)
650		0	\|a Testing.
650		0	\|a Reliability (Engineering)
700	1	0	\|a Kem eny, Tam as.
700	1	0	\|a Havrilla, K.
710	2	0	\|a International Measurement Confederation.
942			\|2 ddc
952			\|0 0 \|1 0 \|4 0 \|6 620_004400000000000_T255 \|7 0 \|8 MN \|9 68822 \|a ML015 \|b ML015 \|c MN \|d 2024-06-02 \|l 0 \|o 620.0044 T255 \|p 072479 \|r 2018-03-24 00:00:00 \|w 2018-03-24 \|y BK
994	0	1	\|a 072479
999			\|c 50973 \|d 50973