Loading…
Thin-film and depth-profile analysis
Saved in:
Other Authors: | Etzkorn, H. W., Oechsner, H (Hans), 1934- |
---|---|
Format: | Book |
Language: | English |
Published: |
Berlin New York
Springer-Verlag
1984
|
Series: | Topics in current physics
37 |
Subjects: | |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Thin films and interfaces : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A. /
Published: (1982) -
Thin films and interfaces II : symposium held November 1983, in Boston, Massachusetts, U.S.A. : proceedings off the Symposium on Thin Films and Interfaces, which was held as a part of the Materials Research Society Meeting, Nov. 14-18, 1983, in Boston --Ack /
Published: (1984) -
Physics of thin films /
by: Eckertov�a, Ludmila
Published: (1977) -
Analytical techniques for thin films /
Published: (1988) -
Characterization of thin films and solid surfaces using proton-induced X-ray emission /
by: Sartwell, Bruce D.
Published: (1980)