Rational fault analysis

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Bibliographic Details
Corporate Authors: Symposium on Rational Fault Analysis (1974 : Texas Tech University), United States, United States. Army Research Office
Other Authors: Liberty, Stanley R., 1942-, Saeks, Richard, 1941-
Format: Book
Language:English
Published: New York M. Dekker c1977
Series:Electrical engineering and electronics 1
Subjects:
Electronic apparatus and appliances > Testing
Electronic apparatus and appliances > Reliability
Automatic checkout equipment
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Description
Item Description:Co-sponsored by the Office of Naval Research and the Army Research Office
Physical Description:ix, 241 p. ill. 24 cm.

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