Advances in x-ray analysis : [proceedings of the 41st annual Conference on Application of X-ray Analysis, held August 3-7, 1992 in Colorado Springs, Colorado /

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Bibliographic Details
Corporate Authors: Conference on Application of X-ray Analysis Colorado, Denver Research Institute
Other Authors: Gilfrich, John V.
Format: Conference Proceeding Book
Language:English
Published: New York : Plenum Press, 1993.
Subjects:
X-rays > Industrial applications.
Chemistry, Analytical > yearbooks.
Radiography > yearbooks.
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