Digital integrated circuit testing from a quality perspective /

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Bibliographic Details
Main Author: Hnatek, Eugene R.
Format: Book
Language:English
Published: New York : Van Nostrand Reinhold, c1993.
Subjects:
Digital integrated circuits > Testing > Quality control.
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LEADER 00000pam a2200000 a 4500
001 00232696
003 PWmBRO
005 20240602103803.0
008 941020s1993 nyua b 001 0 eng
020 |a 0442006438 
100 1 |a Hnatek, Eugene R. 
245 1 0 |a Digital integrated circuit testing from a quality perspective /  |c Eugene R. Hnatek. 
260 |a New York :  |b Van Nostrand Reinhold,  |c c1993. 
300 |a x, 179 p. :  |b ill. 
650 0 |a Digital integrated circuits  |x Testing  |x Quality control. 
942 |2 ddc 
952 |0 0  |1 127  |4 0  |6 621_381548000000000_H677  |7 0  |9 105895  |a ML015  |b ML015  |c ML015  |d 2024-06-02  |l 0  |o 621.381548 H677  |p 104219  |r 2019-03-04 00:00:00  |w 2019-03-04  |y BK 
999 |c 80880  |d 80880 

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