Design of systems and circuits for maximum reliability or maximum production yield /

I tiakina i:
Ngā taipitopito rārangi puna kōrero
Kaituhi matua: Becker, Peter W.
Ētahi atu kaituhi: Jensen, Finn, 1937-
Hōputu: Pukapuka
Reo:Ingarihi
I whakaputaina: New York : McGraw-Hill, c1977.
Ngā marau:
Electronic circuit design > Data processing.
Electronic apparatus and appliances > Reliability > Data processing.
Electronic systems > Design and construction > Data processing.
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MARC

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100 1 0 |a Becker, Peter W. 
245 1 0 |a Design of systems and circuits for maximum reliability or maximum production yield /  |c Peter W. Becker, Finn Jensen. 
260 0 |a New York :  |b McGraw-Hill,  |c c1977. 
300 |a xiv, 293 p. :  |b ill. 
650 0 |a Electronic circuit design  |x Data processing. 
650 0 |a Electronic apparatus and appliances  |x Reliability  |x Data processing. 
650 0 |a Electronic systems  |x Design and construction  |x Data processing. 
700 1 0 |a Jensen, Finn,  |d 1937- 
942 |2 ddc 
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999 |c 74003  |d 74003 

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