Digital systems testing and testable design /

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Библиографические подробности
Главный автор:	Abramovici, Miron
Другие авторы:	Breuer, Melvin A., Friedman, Arthur D.
Формат:	‌
Язык:	английский
Опубликовано:	New York, NY : Computer Science Press, c1990.
Серии:	Electrical engineering communications and signal processing series.
Предметы:	Digital integrated circuits > Testing. Digital integrated circuits > Design and construction.
Метки:	Добавить метку Нет меток, Требуется 1-ая метка записи!

MARC


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020			\|a 0716781794
082	0	0	\|a 621.3/815/A161
100	0	0	\|a Abramovici, Miron.
245	1	0	\|a Digital systems testing and testable design / \|c Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
260	0		\|a New York, NY : \|b Computer Science Press, \|c c1990.
300			\|a xxi, 653 p. : \|b ill.
490	1		\|a Electrical engineering, communications, and signal processing
504			\|a Includes bibliographical references (p. 644-645) and index.
650		0	\|a Digital integrated circuits \|x Testing.
650		0	\|a Digital integrated circuits \|x Design and construction.
700	1	0	\|a Breuer, Melvin A.
700	1	0	\|a Friedman, Arthur D.
830		0	\|a Electrical engineering communications and signal processing series.
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