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    A Novel GRU-Augmented Time-Frequency Estimator for IGBT Remaining Useful Life Prediction

    A Novel GRU-Augmented Time-Frequency Estimator for IGBT Remaining Useful Life Prediction Tekijä Yuankuang Li, Baohua Tan, Yingjie Zhang, Shuo Wang, Bolin Lian, Yuan Li, Zongming Tan

    Julkaistu 2025-01-01

    Aging-induced failure of Insulated Gate Bipolar Transistors (IGBTs) significantly restricts the reliability of power electronic systems. Accurate and efficient prediction of IGBT Remaining Useful Life (RUL) is critical for proactive risk mitigation and ensuring system stability. Despite numerous exi...

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