Search Results - Yonenega, Ichiro

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    In-Situ Analysis of Optoelectronic Properties of Semiconductor Nanostructures and Defects in Transmission Electron Microscopes

    In-Situ Analysis of Optoelectronic Properties of Semiconductor Nanostructures and Defects in Transmission Electron Microscopes by Ohno, Yutaka, Yonenega, Ichiro, Takeda, Seiji

    Published 2011
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